Improve Reflow Oven OEE: Common Recipe FinderTM and ProBotTM Automatic Profiling! Learn more at KIC Booth 701, SMTA Guadalajara
KIC, SMT thermal process experts, will exhibit at the SMTA Guadalajara Expo & Tech Forum, taking place Sept. 11-12, 2024 at the Expo Guadalajara. Attendees are invited to visit KIC at Booth 701 to discover the latest advancements in reflow oven setup, optimization, and monitoring/inspection technology with a special focus on the groundbreaking Common Recipe Finder™.
Reflow Oven OEE: Common Recipe Finder™
KIC’s Common Recipe Finder™ is a revolutionary tool designed to streamline and enhance reflow process setup and optimization to improve Overall Equipment Effectiveness:
Advantages at a Glance
- Intelligent Analysis: Advanced algorithms decode data for pinpoint accuracy.
- Unified Control: Streamline your process with a single recipe or a focused selection.
- Swift Transition: Seamlessly switch from one product to another with minimal hassle.
- Boosted Productivity: Skyrocket throughput and reduce downtime.
- Tailored Precision: Maintain each PCB’s uniqueness while adhering to strict specifications.
Cutting-Edge Profiling and Inspection Technologies
KIC will showcase several other advanced solutions:
- NavigatorTM & Auto Focus Power™ process setup and optimization: Auto Focus Power™ NPI setup utilizes AI and ML algorithms to develop oven recipe settings prior to ever running a profile. NavigatorTM will optimize the profile with oven settings to match your production requirements:
- Quality/High Reliability
- Volume/Throughput
- Sustainability
- ProBot™ Automatic Profiling: The ultimate customizable solution for automatic profiling, ProBot records the profile for each production PCBA, ensuring it meets the established process window in real-time. Automation, Process Control, Traceability without human intervention.
Visit KIC at Booth 701
Join KIC at Booth 701 at the SMTA Guadalajara Expo to explore the future of reflow process optimization with the Common Recipe Finder™ and other advanced profiling and inspection technologies.
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