Dr. Denis Barbini to Present “Utilizing SIR and Analytical Tools to Determine Impact to Reliability for Process Improvements” at SMTA International

ZESTRON, the leading global provider of high-precision cleaning products, services, and training solutions in the electronics manufacturing and semiconductor industries, is excited to announce that Dr. Denis Barbini, Technical Solutions Manager at ZESTRON, will present “Utilizing SIR and Analytical Tools to Determine Impact to Reliability for Process Improvements” at the upcoming SMTA International Conference and Exhibition.

The presentation will delve into the challenges the electronics manufacturing industry faces when implementing new processes, machinery, or materials under Reision H of IPC-J-Std-001. Dr. Barbini, an industry expert with years of experience in the field, will explore how implementing advanced methodologies, such as Surface Insulation Resistance (SIR) testing and other analytical tools, can provide valuable insights into the reliability impact of process enhancements. Attendees will gain understandings into strategies for evaluating the efficacy of cleaning solutions, materials, and processes, ultimately ensuring that product reliability is not compromised.

For more information about ZESTRON’s participation in SMTA International or to learn about their advanced cleaning solutions, visit ZESTRON at booth #1401 during the exhibition, or click here to schedule a meeting.