Advantest Corporation has unveiled the T2000 AiR2X, a next-generation air-cooled test system designed to meet the rising demand for compact, cost-effective testers in evaluation and high-mix, low-volume production environments. This development highlights Advantest’s commitment to addressing market needs with advanced technology solutions.
The T2000 AiR2X is fully compatible with the existing T2000 test system and offers twice the test resources compared to the previous air-cooled T2000 AiR system. It effectively supports the transition from legacy systems, such as the T6500 and T7700 series, which are nearing end-of-life, while catering to the ongoing replacement requirements for compact air-cooled testers.
As air-cooled SoC test systems remain prevalent globally, the T2000 AiR2X positions Advantest to meet ongoing demand in this expanding market. Toshiaki Adachi, leader of the T2000 Product Unit at Advantest, stated, “Our compact, air-cooled T2000 AiR2X and high-density, high-pin-count V93000 create a unified test solution that covers the full spectrum of SoCs—from air-cooled segments to large-scale, digitally rich devices.”
The T2000 AiR2X enhances deployment efficiency, simplifies migration from outdated testers, and doubles resource capacity per floor area. Meanwhile, the V93000 provides the performance necessary for advanced, large-scale SoCs. Together, they offer a complementary solution that reduces SoC deployment costs and environmental impact, supporting customer innovation from evaluation to mass production.
Featuring a flexible measurement configuration, the T2000 AiR2X accommodates up to 12 measurement modules, including functional/SCAN test and high-precision DC testing for automotive devices up to 320V. Its unique multisite controller function significantly reduces test time during volume production.
The system integrates Advantest’s T2000 RECT550 performance board, supporting a wide range of configurations with a unified support infrastructure and expandable module options. It uses the same program environment as the T2000, and the Rapid Development Kit (RDK) decreases the effort required for program creation and debugging, facilitating quicker platform migration and implementation.
Initial evaluations are confirming the T2000 AiR2X’s broad application coverage, spanning industrial MCUs, consumer ASICs, battery-monitoring ICs for automotive and mobile devices, and power analog applications. The system will be generally available later this month. For more information, visit Advantest at SEMICON Japan, Booth E4346, Tokyo Big Sight, from December 17-19, 2025.
